IC designers now have a powerful weapon in the struggle against rising test costs: commercially available EDA solutions that provide fast and effective means to implement scan compression on-chip. By ...

For decades, process and design scaling has triggered the adoption of transformative test solutions. About twenty years ago, when at-speed test became a de-facto requirement, on-chip compression ...

The proliferation of semiconductor devices into safety-critical applications such as automotive and medical opens a new can of worms for test and reliability. An ever widening range of devices must ...

With increasing numbers of ASICs finding their way into high-volume products, production testing of these devices must be fast, complete, trouble-free, and economical. To achieve these goals, ...

Cerritos, CA—Corelis, Inc. introduces ScanExpress Merge, a productivity enhancing software application that extends the use of boundary-scan tools to testing and programming multi-assembly systems ...